The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Jan. 24, 2014
Hitachi High-technologies Corporation, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
In an automatic analysis device, when an external force acts on a probe guardin a horizontal direction, the probe guardmoves in a direction escaping from the external force around a center portionof a test body container installing mechanism, and the probe guardis separated from a fixed position. An outer circumferential wallof the probe guardinvades a test body sampling mechanism track, and thus a risk that a sampling nozzleof a test body sampling mechanisminvades the test body container installing mechanismis avoided by the outer circumferential wall. When the probe guardis separated from the fixed position, this is detected, and thus the operation of the test body sampling mechanismand the test body container installing mechanismis stopped.