The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Nov. 06, 2013
Applicant:

E2v Semiconductors, Saint-Égrève, FR;

Inventors:

Thierry Ligozat, Quaix en Chartreuse, FR;

Bruno Diasparra, Seyssinet, FR;

Assignee:

E2V SEMICONDUCTORS, Saint Egreve, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/335 (2011.01); H04N 5/353 (2011.01); H04N 5/222 (2006.01); H01L 27/146 (2006.01); H04N 5/374 (2011.01); H04N 5/378 (2011.01);
U.S. Cl.
CPC ...
H04N 5/3535 (2013.01); H01L 27/14643 (2013.01); H04N 5/2226 (2013.01); H04N 5/353 (2013.01); H04N 5/374 (2013.01); H04N 5/378 (2013.01);
Abstract

The invention relates to image sensors, and more particularly to matrix sensors having active pixels in CMOS technology. According to the invention, a method for imaging a scene with a very short integration time, by using a standard image sensor comprising a matrix of pixels, comprising photodiodes, and charge storage nodes, is provided. Two images of the same scene are produced under identical light conditions, one of the images corresponding to integration of charges during a first time interval with a duration Tand the other image corresponding to a second time interval with a duration T'longer than T, and a difference between these two images is established, representing an image integrated during a time interval T′−T. The light may be provided by a light pulse (IMP). This method may be used for observing points in a scene that lie at a well-determined distance, the brevity of the integration time allowing good precision of the observation distance.


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