The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Jun. 25, 2014
Applicant:

Symantec Corporation, Mountain View, CA (US);

Inventors:

Sourabh Satish, Fremont, CA (US);

Himanshu Dubey, Gwalior, IN;

Vipul Sawant, Pune, IN;

Assignee:

Symantec Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 17/30 (2006.01); G06F 21/51 (2013.01);
U.S. Cl.
CPC ...
H04L 63/1416 (2013.01); G06F 17/30595 (2013.01); H04L 63/20 (2013.01); G06F 21/51 (2013.01);
Abstract

A computer-implemented method for identifying variants of samples based on similarity analysis may include (1) collecting, from security agents on endpoint computing systems, metadata attributes that describe samples identified by the security agents over an initial period of time, (2) collecting metadata attributes that describe a current sample identified after the initial period of time, (3) comparing at least two of the metadata attributes that describe the current sample with corresponding metadata attributes of the samples identified over the initial period of time, (4) designating the current sample as related to another sample from the samples identified over the initial period of time based on the comparison of the two metadata attributes, and (5) performing a security action to protect a user from malware based on the designation of the current sample as related to the other sample. Various other methods, systems, and computer-readable media are also disclosed.

Published as:

Find Patent Forward Citations

Satish, Sourabh. (2017). Systems and methods for identifying variants of samples based on similarity analysis (U.S. Patent No. 9571509). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9571509

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…