The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Mar. 24, 2016
Applicant:

Rf Micro Devices, Inc., Greensboro, NC (US);

Inventors:

Thong Dang, Summerfield, NC (US);

Dan Carey, Kernersville, NC (US);

Ma Shirley Asoy, High Point, NC (US);

Assignee:

Qorvo US, Inc., Greensboro, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/78 (2006.01); H01L 23/552 (2006.01); H01L 23/31 (2006.01); H01L 21/768 (2006.01); H01L 21/3105 (2006.01); H01L 21/268 (2006.01); H01L 21/683 (2006.01); H01L 21/56 (2006.01); H01L 21/3205 (2006.01); H01L 25/00 (2006.01); H01L 25/065 (2006.01); H01L 21/48 (2006.01);
U.S. Cl.
CPC ...
H01L 23/552 (2013.01); H01L 21/268 (2013.01); H01L 21/31058 (2013.01); H01L 21/32051 (2013.01); H01L 21/4817 (2013.01); H01L 21/561 (2013.01); H01L 21/565 (2013.01); H01L 21/568 (2013.01); H01L 21/6835 (2013.01); H01L 21/76895 (2013.01); H01L 21/78 (2013.01); H01L 23/3157 (2013.01); H01L 25/0655 (2013.01); H01L 25/50 (2013.01);
Abstract

The present disclosure integrates electromagnetic shielding into a wafer level fan-out packaging process. First, a mold wafer having multiple modules is provided. Each module includes a die with an I/O port and is surrounded by an inter-module area. A redistribution structure that includes a shield connected element coupled to the I/O port of each module is formed over a bottom surface of the mold wafer. The shield connected element extends laterally from the I/O port into the inter-module area for each module. Next, the mold wafer is sub-diced at each inter-module area to create a cavity. A portion of the shield connected element is then exposed through the bottom of each cavity. A shielding structure is formed over a top surface of the mold wafer and exposed faces of each cavity. The shielding structure is in contact with the shield connected element.


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