The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2017
Filed:
Jul. 22, 2014
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventor:
Lorenz Lechner, Dublin, CA (US);
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/20 (2006.01); B32B 38/00 (2006.01); B32B 38/10 (2006.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); B32B 38/0004 (2013.01); B32B 38/10 (2013.01); H01J 2237/026 (2013.01); H01J 2237/31745 (2013.01); Y10T 156/1052 (2015.01);
Abstract
A method for manufacturing a TEM-lamella is disclosed. The method includes: disposing a self-supporting protective structure on a surface of a substrate; bonding the protective structure to the substrate; cutting out a lamella from the substrate using a particle beam so that the lamella remains bonded to at least a portion of the protective structure; fastening a first tool to the lamella; and moving away the lamella from a residual portion of the substrate by moving the first tool relative to the substrate.