The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Jan. 12, 2012
Applicant:

Boaz Brill, Rehovot, IL;

Inventor:

Boaz Brill, Rehovot, IL;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/04 (2006.01); G03B 27/32 (2006.01); G03B 27/74 (2006.01); G03G 15/00 (2006.01); G03F 7/20 (2006.01); G01N 21/47 (2006.01); G01B 11/14 (2006.01); G01N 21/84 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
G03G 15/50 (2013.01); G01B 11/14 (2013.01); G01N 21/4788 (2013.01); G03F 7/705 (2013.01); G03F 7/70625 (2013.01); G03F 7/70633 (2013.01); G03F 7/70641 (2013.01); G03F 7/70683 (2013.01); G01B 2210/56 (2013.01); G01N 2021/8416 (2013.01); H01L 22/12 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A method of controlling a manufacturing process, the method including the steps of a) providing a testing area with a periodic structure, where the periodic structure includes a series of sets of patterned features, b) illuminating the periodic structure with a light, thereby producing a non-zero order diffraction signal, c) collecting the diffraction signal to produce a test signature, d) matching the test signature with a reference signature, where the reference signature was previously produced by performing steps a), b), and c) with respect to a reference structure that is at least similar to the periodic structure, and e) controlling a manufacturing process using a control setting set associated with the matching reference signature.


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