The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Oct. 29, 2014
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Ehud Udi Shoor, Haifa, IL;

Dror Lazar, Kiryat Bialik, IL;

Adee O. Ran, Maayan Baruch, IL;

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01M 11/00 (2006.01); H04B 3/46 (2015.01); H04B 3/36 (2006.01);
U.S. Cl.
CPC ...
G01R 31/021 (2013.01); G01M 11/33 (2013.01); H04B 3/46 (2013.01); H04B 3/36 (2013.01);
Abstract

Embodiments of the present disclosure provide configurations for testing arrangements for testing multi-lane active cables. In one embodiment, a testing arrangement may comprise a testing module comprising a pattern generator to be coupled with an active cable having a plurality of lanes to generate a test pattern to be transmitted over the active cable, wherein the test pattern is to be transmitted at least over two or more lanes of the active cable that are concatenated, and a processing unit to be coupled with the active cable to process a result of the transmission of the test pattern over the active cable. The arrangement may further include a plurality of testing cables to concatenate two or more of the lanes of the active cable, to enable the transmission of the test pattern over the concatenated lanes of the active cable. Other embodiments may be described and/or claimed.


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