The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2017

Filed:

Jun. 03, 2014
Applicant:

Advantest Corporation, Tokyo, JP;

Inventor:

Tomoyuki Yamane, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/263 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2635 (2013.01);
Abstract

A server stores multiple configuration data which respectively provide different functions to a test system. A tester hardware is configured to be capable of changing at least a part of its functions according to the configuration data stored in nonvolatile memory included in the tester hardware. A control program is installed on an information processing apparatus. The control program provides the information processing apparatus with (i) a function of displaying multiple configuration data candidates on a display when the test system is set up, and (ii) a function of writing the configuration data selected by the user to the nonvolatile memory of the tester hardware.


Find Patent Forward Citations

Yamane, Tomoyuki. (2017). Test system (U.S. Patent No. 9563527). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9563527

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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