The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2017

Filed:

Sep. 24, 2015
Applicant:

Sandisk Technologies Inc., Plano, TX (US);

Inventors:

Guirong Liang, Santa Clara, CA (US);

Zhenming Zhou, San Jose, CA (US);

Masaaki Higashitani, Cupertino, CA (US);

Assignee:

SANDISK TECHNOLOGIES LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G11C 16/14 (2006.01); G11C 16/26 (2006.01); G11C 16/34 (2006.01); G11C 11/56 (2006.01); G11C 5/06 (2006.01); G11C 16/04 (2006.01); H01L 27/115 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G11C 11/5628 (2013.01); G11C 16/14 (2013.01); G11C 16/26 (2013.01); G11C 16/349 (2013.01); G11C 16/3418 (2013.01); G06F 11/1048 (2013.01); G11C 5/063 (2013.01); G11C 16/0483 (2013.01); G11C 16/3427 (2013.01); G11C 2211/5644 (2013.01); H01L 27/11524 (2013.01);
Abstract

Systems and methods for performing partial block erase operations on a subset of word lines within a memory array prior to performing data refreshing or open-block programming are described. In some cases, data stored in memory cells connected to a word line with a fail bit count above an error threshold (e.g., more than two bit errors per page or more than three bit errors per word line) may be refreshed by performing a read operation on the memory cells, generating corrected data for the memory cells, performing a partial block erase operation on one or more word lines including the word line, and then writing the corrected data into the memory cells. The one or more word lines may include the word line with the fail bit count above the error threshold and an adjacent word line that is adjacent to the word line.


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