The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2017
Filed:
Apr. 17, 2012
Chihiro Manri, Tokyo, JP;
Satoshi Mitsuyama, Tokyo, JP;
Tomonori Mimura, Tokyo, JP;
Kumiko Kamihara, Tokyo, JP;
Chihiro Manri, Tokyo, JP;
Satoshi Mitsuyama, Tokyo, JP;
Tomonori Mimura, Tokyo, JP;
Kumiko Kamihara, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
Accuracy control of an automatic analysis device that mixes a sample and a reagent to measure temporal change of a mixed solution is realized. A plurality of measurement point data is acquired from a reaction process of the sample and the reagent. Parameters and test values of approximate equations for approximating the plurality of measurement point data are accumulated in a storage unit. A distribution map of reference data corresponding to the parameters or the test values is created based on predetermined numbers of the parameters or the test values accumulated in the storage unit. Next, a plurality of screens for individually superimposing, on the distribution map, curved lines corresponding to a plurality of regression function candidates obtained by applying a plurality of regression functions are arranged and presented on a display screen, so as to approximate the data to the distribution map of the reference data.