The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2017

Filed:

Nov. 07, 2014
Applicant:

Freescale Semiconductor, Inc., Austin, TX (US);

Inventor:

Michael Naumann, Chandler, AZ (US);

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 7/06 (2006.01); G01P 15/08 (2006.01); G01P 15/06 (2006.01); G01P 15/03 (2006.01); G01M 7/08 (2006.01);
U.S. Cl.
CPC ...
G01M 7/08 (2013.01); G01P 15/03 (2013.01); G01P 15/036 (2013.01); G01P 15/06 (2013.01); G01P 15/0891 (2013.01);
Abstract

A micromechanical shock sensor includes a proof mass coupled to a surface of a substrate and a projection element extending laterally from the proof mass. The shock sensor further includes a latch mechanism and a retention anchor. The latch mechanism has a latch spring attached to the surface and a latch tip extending from a movable end of the latch spring. The retention anchor is attached to the surface and is located proximate the latch tip. The proof mass is configured for planar movement relative to the substrate when the proof mass is subjected to a force of at least a threshold magnitude. Movement of the proof mass in response to the force causes the latch tip to become retained between the projection element and the retention anchor to place the shock sensor in a latched state. The latched state may be detected by optical inspection, probe, or external readout.


Find Patent Forward Citations

Naumann, Michael. (2017). Shock sensor with latch mechanism and method of shock detection (U.S. Patent No. 9562825). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9562825

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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