The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Oct. 19, 2015
Applicant:

Hitachi Kokusai Electric Inc., Tokyo, JP;

Inventors:

Kimihiko Nakatani, Toyama, JP;

Kazuhiro Harada, Toyama, JP;

Hiroshi Ashihara, Toyama, JP;

Ryuji Yamamoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); C23C 16/52 (2006.01); C23C 16/455 (2006.01); H01L 21/28 (2006.01); H01L 21/285 (2006.01); C23C 16/06 (2006.01); C23C 16/14 (2006.01); C23C 16/56 (2006.01); H01L 29/51 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0228 (2013.01); C23C 16/06 (2013.01); C23C 16/14 (2013.01); C23C 16/45527 (2013.01); C23C 16/45544 (2013.01); C23C 16/45553 (2013.01); C23C 16/52 (2013.01); C23C 16/56 (2013.01); H01L 21/02123 (2013.01); H01L 21/02172 (2013.01); H01L 21/02205 (2013.01); H01L 21/02318 (2013.01); H01L 21/28079 (2013.01); H01L 21/28562 (2013.01); H01L 21/76877 (2013.01); H01L 29/517 (2013.01);
Abstract

A method of manufacturing a semiconductor device includes: (a) forming a first film containing a metal element on a substrate by performing a cycle a predetermined number of times, the cycle including: (a-1) supplying a first precursor gas being a fluorine-free inorganic gas containing the metal element to the substrate; and (a-2) supplying a first reactant gas having reducibility to the substrate; (b) forming a second film containing the metal element on the first film by performing a cycle a predetermined number of times, the cycle including: (b-1) supplying a second precursor gas containing the metal element and fluorine to the substrate; and (b-2) supplying a second reactant gas having reducibility to the substrate; and (c) forming a film containing the metal element and obtained by the first film and the second film being laminated on the substrate by performing the (a) and (b).


Find Patent Forward Citations

Loading…