The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2017
Filed:
Dec. 31, 2014
Cadence Design Systems, Inc., San Jose, CA (US);
Tal Yanai, Tel Mond, IL;
Yuval Konrad, Rishon LeZion, IL;
Cadence Design Systems, Inc., San Jose, CA (US);
Abstract
A system and method for providing a scalable server-implemented regression query environment for remote testing and analysis of a chip-design model receives chip-design information, including the chip-design model to be tested and one or more attributes for testing the chip design model; receives a first regression simulation test request from the client-side integration client; initiates a proxy instance for a first regression simulation test to be executed by an application programming interface (API), based on the first regression simulation test request; selects, by the API, the attributes for testing the chip-design model; executes, by the API, the first regression simulation test on the chip-design model using the selected attributes; monitors, by a server-side database manager, the first regression simulation test during execution of the first regression simulation test; and stores, by the server-side database manager, one or more results of the first regression simulation test in a database.