The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2017
Filed:
Jul. 23, 2015
National Instruments Corporation, Austin, TX (US);
Jeffrey N. Correll, Cedar Park, TX (US);
Dustyn K. Blasig, Pflugerville, TX (US);
Newton G. Petersen, Emporia, KS (US);
National Instruments Corporation, Austin, TX (US);
Abstract
When compiling high-level, graphical code (e.g. LabVIEW™ code) to a different representation (e.g. different software code or hardware FPGA), information relating to characteristics of the design may be collected/captured from the compilation process, and automatically provided to all the earlier stages of the compilation process to obtain more optimal results. Without automated feedback of this information, users have to manually identify, produce, and provide the feedback information, or forego the process altogether, having to assume that the tool has produced the best possible results when that may not be the case. To correct timing, failed constraints paths may be parsed and compared to delays obtained during a previous compile, and previous adjustments that didn't yield desired results may be undone. The longest delay that didn't result from an undone path may then be identified, and adjusted, and the process may be repeated until all paths are predicted to pass.