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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9557326 B1

PDFFull Text
Date of Patent:
Jan. 31, 2017

Filed:

Jun. 07, 2011

Sample analyzing device and sample analyzing method

Applicants:

Toru Inaba, Tokyo, JP;

Shinya Matsuoka, Hitachinaka, JP;

Taku Sakazume, Hitachinaka, JP;

Yoshihiro Yamashita, Hitachinaka, JP;

Masafumi Shimada, Hitachinaka, JP;

Osamu Kogi, Yokohama, JP;

Yushi Harada, Ushiku, JP;

Inventors:

Toru Inaba, Tokyo, JP;

Shinya Matsuoka, Hitachinaka, JP;

Taku Sakazume, Hitachinaka, JP;

Yoshihiro Yamashita, Hitachinaka, JP;

Masafumi Shimada, Hitachinaka, JP;

Osamu Kogi, Yokohama, JP;

Yushi Harada, Ushiku, JP;

Assignee:

Hitachi High-Technologies Corporation, Tokyo, JP;

Attorney:

Miles & Stockbridge P.C.

Primary Examiner:

Rebecca Martinez

Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 33/53 (2006.01); B03C 1/033 (2006.01); B03C 1/28 (2006.01); B03C 1/01 (2006.01); G01N 33/574 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/5306 (2013.01); B03C 1/01 (2013.01); B03C 1/033 (2013.01); B03C 1/0332 (2013.01); B03C 1/288 (2013.01); G01N 33/54326 (2013.01); G01N 33/57438 (2013.01); G01N 33/57484 (2013.01); B03C 2201/18 (2013.01); B03C 2201/22 (2013.01); B03C 2201/24 (2013.01); B03C 2201/26 (2013.01); G01N 35/0098 (2013.01);
Abstract

This invention provides a sample analyzing device and sample analyzing method designed to suppress nonuniform capture of magnetic particles () and detect a desired substance with higher accuracy. The sample analyzing device includes a flow channel () that conducts thereinto a sample which contains the magnetic particles (), and magnetic field generating means () that generates magnetic fields for capturing the magnetic particles () in a magnetic particles capturing region of the flow channel (); wherein the flow channel has at least one of structural characteristics that a cross-sectional area of the flow channel, at a downstream end of the magnetic particles capturing region, is larger than a cross-sectional area of the flow channel, at an upstream end of the magnetic particles capturing region, and that the magnetic fields generated by the magnetic field generating means () have a greater magnitude at a downstream side of the magnetic particles capturing region than at an upstream side thereof.

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