The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2017

Filed:

Nov. 27, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Gerald K. Bartley, Rochester, MN (US);

David J Braun, St. Charles, MN (US);

John R Dangler, Rochester, MN (US);

Matthew S Doyle, Rochester, MN (US);

Thomas D Kidd, Stewartville, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 3/22 (2006.01); H05K 3/40 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
H05K 3/225 (2013.01); G01R 31/2808 (2013.01); G01R 31/2812 (2013.01); H05K 3/4046 (2013.01); Y10T 29/49124 (2015.01);
Abstract

A removable, permanent or reconfigurable debug probing device for use in debug probing of a printed circuit assembly, the printed circuit assembly having at least one through via, the debug probing device comprising at least one leader thread configured to be threaded through the at least one through via. Using the probing device comprises inserting a selected one of the at least one leader threads through a selected one of the at least one through via to thereby probe a surface of the printed circuit assembly; and responsive to detecting a defect in the selected through via, using a flexible circuit connected to the selected leader thread to repair the detected defect.


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