The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2017

Filed:

Dec. 20, 2013
Applicants:

Ashwini K. Sinha, East Amherst, NY (US);

Douglas C. Heiderman, Akron, NY (US);

Lloyd A. Brown, East Amherst, NY (US);

Serge M. Campeau, Lancaster, NY (US);

Robert Shih, HsinChu, TW;

Dragon LU, Miaoli County, TW;

Wen-pin Chiu, Hsin-chu County, TW;

Chien-kang Kao, New Taipei, TW;

Inventors:

Ashwini K. Sinha, East Amherst, NY (US);

Douglas C. Heiderman, Akron, NY (US);

Lloyd A. Brown, East Amherst, NY (US);

Serge M. Campeau, Lancaster, NY (US);

Robert Shih, HsinChu, TW;

Dragon Lu, Miaoli County, TW;

Wen-Pin Chiu, Hsin-chu County, TW;

Chien-Kang Kao, New Taipei, TW;

Assignee:

PRAXAIR TECHNOLOGY, INC., Danbury, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/425 (2006.01); H01L 21/265 (2006.01); C01B 3/00 (2006.01); C23C 14/34 (2006.01); H01J 37/317 (2006.01); H01J 37/30 (2006.01); F17C 1/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/265 (2013.01); C01B 3/00 (2013.01); C23C 14/34 (2013.01); F17C 1/005 (2013.01); H01J 37/3002 (2013.01); H01J 37/3171 (2013.01); F17C 2201/0109 (2013.01); F17C 2201/0114 (2013.01); F17C 2201/035 (2013.01); F17C 2201/058 (2013.01); F17C 2203/0617 (2013.01); F17C 2205/035 (2013.01); F17C 2205/0329 (2013.01); F17C 2205/0332 (2013.01); F17C 2205/0335 (2013.01); F17C 2205/0338 (2013.01); F17C 2205/0385 (2013.01); F17C 2205/0391 (2013.01); F17C 2225/038 (2013.01); F17C 2260/044 (2013.01); F17C 2270/0518 (2013.01); F17C 2270/0745 (2013.01); H01J 2237/006 (2013.01); Y02E 60/321 (2013.01); Y10T 137/2012 (2015.04);
Abstract

A supply source for delivery of a CO-containing dopant gas composition is provided. The composition includes a controlled amount of a diluent gas mixture such as xenon and hydrogen, which are each provided at controlled volumetric ratios to ensure optimal carbon ion implantation performance. The composition can be packaged as a dopant gas kit consisting of a CO-containing supply source and a diluent mixture supply source. Alternatively, the composition can be pre-mixed and introduced from a single source that can be actuated in response to a sub-atmospheric condition achieved along the discharge flow path to allow a controlled flow of the dopant mixture from the interior volume of the device into an ion source apparatus.


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