The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2017
Filed:
Jul. 27, 2016
Freescale Semiconductor Inc., Austin, TX (US);
George R. Kunnen, Chandler, AZ (US);
Mark A. Lancaster, Scottsdale, AZ (US);
NXP USA, Inc., Austin, TX (US);
Abstract
The embodiments described herein provide calibration systems and methods for mixed-signal devices. Specifically, the embodiments provide systems and methods for calibrating mixed-signal devices that can facilitate effective calibration of such mixed-signal devices, including mixed-signal devices with poorly characterized nonlinearities that cannot be effectively calibrated with traditional calibration techniques. In general, the embodiments described herein calibrate by measuring output values from a mixed-signal device with a known calibration input values being applied. The measured output values are used to determine localized polynomial interpolants. Each of the determined localized polynomial interpolants is then evaluated at an uncorrected output value, and the evaluated localized polynomial interpolants are then used to generate correction values.