The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2017

Filed:

May. 04, 2015
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Ludovic Marc Larzul, Folsom, CA (US);

Frederic Maxime Emirian, Antony, FR;

Sebastien Roger Delerse, Brétigny sur orge, FR;

Assignee:

Synopsys, Inc., Mountain Veiw, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 11/22 (2006.01); G01R 31/317 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31723 (2013.01); G01R 31/3177 (2013.01); G01R 31/31703 (2013.01); G01R 31/31705 (2013.01);
Abstract

Embodiments relate to the emulation of circuits, and detecting an event in a plurality of signals in an emulated circuit. A host system incorporates global event detection logic into a design under test (DUT). An emulator emulates the DUT along with the incorporated global event detection logic. The global event detection logic divides one clock cycle of the DUT into multiple time periods. During each time period of the clock cycle, the emulator selects a different subset of signals from the plurality of signals of the DUT. The emulator determines whether an event occurred for a signal from the subset during the clock cycle. If an event is detected, the emulator generates an output indicating an event was detected among the plurality of signals.


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