The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Oct. 21, 2015
Applicants:

Melexis Technologies NV, Tessenderlo, BE;

X-fab Semiconductor Foundries Ag, Erfurt, DE;

Inventors:

Christian Schott, Lussy-sur-Morges, CH;

Peter Hofmann, Radeberg, DE;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 43/14 (2006.01); G01R 33/07 (2006.01); H01L 43/06 (2006.01); H01L 43/04 (2006.01);
U.S. Cl.
CPC ...
H01L 43/065 (2013.01); G01R 33/07 (2013.01); G01R 33/077 (2013.01); H01L 43/04 (2013.01); H01L 43/14 (2013.01);
Abstract

A semiconductor chip for measuring a magnetic field based on the Hall effect. The semiconductor chip comprises an electrically conductive well having a first conductivity type, in a substrate having a second conductivity type. The semiconductor chip comprises at least four well contacts arranged at the surface of the well, and having the first conductivity type. The semiconductor chip comprises a plurality of buffer regions interleaved with the well contacts and having the first conductivity type. The buffer regions are highly conductive and the buffer region dimensions are such that at least part of the current from a well contact transits through one of its neighboring buffer regions.


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