The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Sep. 14, 2012
Michael Priel, Netanya, IL;
Asher Berkovitz, Kiryat Ono, IL;
Slavaf Fleshel, Ashkelon, IL;
Amir Grinshpon, Tel Aviv, IL;
Dan Kuzmin, Givat Shmuel, IL;
Yoav Miller, Rehovot, IL;
Michael Priel, Netanya, IL;
Asher Berkovitz, Kiryat Ono, IL;
Slavaf Fleshel, Ashkelon, IL;
Amir Grinshpon, Tel Aviv, IL;
Dan Kuzmin, Givat Shmuel, IL;
Yoav Miller, Rehovot, IL;
FREESCALE SEMICONDUCTOR, INC., Austin, TX (US);
Abstract
A method and apparatus for selecting data path elements for cloning within an integrated circuit (IC) design is described. The method comprises performing timing analysis of at least one data path within the IC design to determine at least one timing slack value for the at least one data path, calculating at least one annotated delay value for cloning a candidate element within the at least one data path, calculating at least one modified slack value for the at least one data path in accordance with the at least one calculated annotated delay value, and validating the cloning of the candidate element based at least partly on the at least one modified slack value.