The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Aug. 07, 2012
David Eric Schwartz, San Carlos, CA (US);
Matthew D. Eisaman, Port Jefferson, NY (US);
Sourobh Raychaudhuri, Mountain View, CA (US);
Philipp H. Schmaelzle, Los Altos, CA (US);
Robert A. Street, Palo Alto, CA (US);
Sean Garner, San Francisco, CA (US);
Baomin Xu, San Jose, CA (US);
Jiye Lee, Cambridge, MA (US);
David Eric Schwartz, San Carlos, CA (US);
Matthew D. Eisaman, Port Jefferson, NY (US);
Sourobh Raychaudhuri, Mountain View, CA (US);
Philipp H. Schmaelzle, Los Altos, CA (US);
Robert A. Street, Palo Alto, CA (US);
Sean Garner, San Francisco, CA (US);
Baomin Xu, San Jose, CA (US);
Jiye Lee, Cambridge, MA (US);
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Abstract
A mechanical method for producing micro-scale and nano-scale textures that facilitates, for example, the cost-effective production of nanostructures on large-scale substrates, e.g., during the large-scale production of thin-film solar cells. A 'scratcher' (multi-pointed abrasion mechanism) is maintained in a precise position relative to a target substrate such that micron-level features (protrusions) extending from the scratcher's base structure are precisely positioned to contact a surface material layer of the target substrate with a predetermined amount of force, and then moved relative to the substrate (e.g., by way of a conveying mechanism) while maintaining the pressing force such that the micron-level features define elongated parallel nano-scale grooves and/or form nano-scale ridges in the surface material layer (i.e., by mechanically displacing) portions of the surface material layer to form the nano-scale grooves/ridges).