The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Sep. 18, 2015
Luxtera, Inc., Carlsbad, CA (US);
Josephus Van Engelen, Carlsbad, CA (US);
Aaron Buchwald, Carlsbad, CA (US);
Ralph Duncan, Carlsbad, CA (US);
Entropic Communications, LLC, Carlsbad, CA (US);
Abstract
A system for calibrating time interleaved ADCs is disclosed and may include a time interleaved analog-to-digital converter (ADC) for converting analog signals to digital signals, the time interleaved ADC comprising: a plurality of active slices, and a plurality of reference slices, each reference slice associated with a corresponding one of the plurality of active slices. An output of each reference slice may be used to correct distortion in an output of the corresponding active slice. Each active slice may sample an input signal at a first rate and each associated reference slice may sample the input signal at a second rate, the second rate being slower than the first rate. Each sample taken by one of the plurality of reference slices may then be taken concurrent with a sample taken by the associated active slice. Each reference slice may include a reference sampling module and a dummy load.