The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2016

Filed:

Aug. 12, 2013
Applicants:

Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi, JP;

Nippon Steel & Sumitomo Metal Corporation, Tokyo, JP;

Inventors:

Motohisa Kado, Gotenba, JP;

Kazuhiko Kusunoki, Tokyo, JP;

Kazuhito Kamei, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 9/04 (2006.01); H01L 21/02 (2006.01); C30B 29/36 (2006.01); C30B 17/00 (2006.01); C30B 9/06 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02628 (2013.01); C30B 9/06 (2013.01); C30B 17/00 (2013.01); C30B 29/36 (2013.01); H01L 21/02529 (2013.01); H01L 21/02598 (2013.01);
Abstract

Provided is a method for producing an SiC single crystal, which is capable of greatly increasing the growth rate in a solution technique in comparison to conventional methods. A method for producing an SiC single crystal, wherein an SiC single crystal is grown by bringing a seed crystal substrate into contact with an Si—C solution that is put in a crucible and has a temperature gradient decreasing from the inside to the liquid level, and wherein the value of depth/inner diameter of the crucible is less than 1.71 and the temperature gradient of the Si—C solution from the liquid level to 10 mm below the liquid level is larger than 42° C./cm.


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