The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2016

Filed:

Mar. 25, 2014
Applicant:

Advanced Technology Materials, Inc., Danbury, CT (US);

Inventors:

David Angst, New Tripoli, PA (US);

Peng Zhang, Montvale, NJ (US);

Jeffrey Barnes, Bethlehem, CT (US);

Prerna Sonthalia, Mumbai, IN;

Emanuel Cooper, Scarsdale, NY (US);

Karl Boggs, Hopewell Junction, NY (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C11D 3/00 (2006.01); C11D 7/32 (2006.01); C11D 11/00 (2006.01);
U.S. Cl.
CPC ...
C11D 3/0073 (2013.01); C11D 3/0084 (2013.01); C11D 7/32 (2013.01); C11D 11/0047 (2013.01);
Abstract

An cleaning composition and process for cleaning post-chemical mechanical polishing (CMP) residue and contaminants from a microelectronic device having said residue and contaminants thereon. The cleaning compositions include novel corrosion inhibitors. The composition achieves highly efficacious cleaning of the post-CMP residue and contaminant material from the surface of the microelectronic device without compromising the low-k dielectric material or the copper interconnect material.


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