The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2016
Filed:
Oct. 23, 2014
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventor:
Rajat Sagar, Karnataka, IN;
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 5/232 (2006.01); H04N 5/238 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); H04N 5/238 (2013.01); H04N 5/23222 (2013.01);
Abstract
A method of analyzing a digital camera includes generating first image data using an image sensor in the camera. A first analysis is performed on at least one portion of the first image data. Second image data is generated using the image sensor and a second analysis is performed on the at least one portion of the second image data. The results of the first analysis are compared to the results of the second analysis. A signal indicating a fault with the digital camera is generated in response to the first analysis differing from the second analysis by a predetermined amount.