The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2016

Filed:

Jun. 13, 2014
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Ryan M. Hatcher, Swarthmore, PA (US);

Mark S. Rodder, Dallas, TX (US);

Robert C. Bowen, Austin, TX (US);

Jorge A. Kittl, Round Rock, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/04 (2006.01); H01L 29/778 (2006.01); H01L 29/12 (2006.01); H01L 29/78 (2006.01); H01L 29/267 (2006.01); H01L 29/66 (2006.01); H01L 29/06 (2006.01); H01L 29/22 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7781 (2013.01); H01L 29/122 (2013.01); H01L 29/045 (2013.01); H01L 29/0657 (2013.01); H01L 29/22 (2013.01); H01L 29/267 (2013.01); H01L 29/66431 (2013.01); H01L 29/785 (2013.01);
Abstract

Integrated circuit devices including strained channel regions and methods of forming the same are provided. The integrated circuit devices may include enhancement-mode field effect transistors. The enhancement-mode field effect transistors may include a quantum well channel region having a well thickness Tsufficient to yield a strain-induced splitting of a plurality of equivalent-type electron conduction states therein to respective unequal energy levels including a lowermost energy level associated with a lowermost surface roughness scattering adjacent a surface of the channel region when, the surface is biased into a state of inversion.


Find Patent Forward Citations

Loading…