The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2016
Filed:
Nov. 08, 2012
Applicant:
Rambus Inc., Sunnyvale, CA (US);
Inventors:
Thomas Vogelsang, Mountain View, CA (US);
David Geoffrey Stork, Portola Valley, CA (US);
Jie Shen, Fremont, CA (US);
Yeuyong Wang, Sunnyvale, CA (US);
Marko Aleksic, Mountain View, CA (US);
Assignee:
Rambus Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/353 (2011.01); H04N 5/335 (2011.01); H04N 5/3745 (2011.01); H04N 5/369 (2011.01);
U.S. Cl.
CPC ...
H04N 5/353 (2013.01); H04N 5/3355 (2013.01); H04N 5/3696 (2013.01); H04N 5/37455 (2013.01); H04N 5/37457 (2013.01);
Abstract
In an integrated-circuit image sensor, binary sample values are read out from an array of pixels after successive sampling intervals that collectively span an image exposure interval and include at least two sampling intervals of unequal duration. Each pixel of the array is conditionally reset after each of the successive sampling intervals according to whether the pixel yields a binary sample in a first state or a second state.