The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2016

Filed:

Dec. 16, 2014
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Pascal A. Meinerzhagen, Hillsboro, OR (US);

Sandip Kundu, Amherst, MA (US);

James W. Tschanz, Portland, OR (US);

Vivek K. De, Beaverton, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/00 (2006.01); H03K 19/003 (2006.01); H03K 5/26 (2006.01);
U.S. Cl.
CPC ...
H03K 19/00323 (2013.01); H03K 5/26 (2013.01);
Abstract

Described are apparatuses and methods for detecting or repairing minimum-delay errors. The apparatus may include a minimum-delay error detector (MDED) to receive a clock signal and a data path signal and to detect a minimum-delay error (MDE) in the data path based on the received data path signal and the clock signal. The MDE may be repaired by adjusting one or more regional clock buffers coupled to the MDED. Further, the apparatus may include minimum-delay path replicas (MDPRs) used for detecting and repairing MDEs during normal system operations. Other embodiments may be described and/or claimed.


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