The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2016

Filed:

Aug. 27, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Byung Kyu Chung, Seoul, KR;

Jung Sub Kim, Hwaseong-si, KR;

Soo Jeong Choi, Hwaseong-si, KR;

Yeon Woo Seo, Hwaseong-si, KR;

Dong Gun Lee, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 33/24 (2010.01); H01L 33/32 (2010.01); H01L 33/12 (2010.01); H01L 33/18 (2010.01); H01L 33/08 (2010.01); H01L 33/06 (2010.01);
U.S. Cl.
CPC ...
H01L 33/24 (2013.01); H01L 33/12 (2013.01); H01L 33/18 (2013.01); H01L 33/32 (2013.01); H01L 33/06 (2013.01); H01L 33/08 (2013.01);
Abstract

There is provided a nanostructure semiconductor light emitting device including: a base layer formed of a first conductivity-type nitride semiconductor; and a plurality of light emitting nanostructures disposed to be spaced apart from one another on the base layer, wherein each of the plurality of light emitting nanostructures includes a nanocore formed of a first conductivity-type nitride semiconductor; a stress control layer disposed on a surface of the nanocore and including a nitride semiconductor containing indium; an active layer disposed on the stress control layer; a second conductivity-type nitride semiconductor layer disposed on the active layer; and a defect blocking layer disposed on at least a portion of the stress control layer and including a nitride semiconductor layer having a lattice constant lower than that of the stress control layer.


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