The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2016
Filed:
Nov. 22, 2012
Hitachi High-technologies Corporation, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
An automatic analyzer detects measurement value abnormalities stemming from reaction process anomalies caused by the presence of foreign matter or bubbles. It is determined whether the results of concentration calculation based on light quantity data from multiple target detectors each fall within an applicable determination range. If the results fall within the determination range, an average value of the results of concentration calculation with the target detectors is calculated, and if not, an out-of-determination-range flag is given. A default fluctuation range is retrieved regarding the average value of the results of concentration calculation. The fluctuation range of the results of concentration calculation with the multiple target detectors is calculated. If the fluctuation range is found to fall within the default range, the results of concentration calculation are output to a display; and if outside the default range, a reexamination request is displayed with an added measurement value abnormality alarm.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile