The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Nov. 13, 2013
Applicant:
Sandisk Technologies Inc., Plano, TX (US);
Inventors:
Chun Sum Yeung, Milpitas, CA (US);
Jian Chen, Menlo Park, CA (US);
Aaron Lee, Mountain View, CA (US);
Abhijeet Manohar, Bangalore, IN;
Chris Avila, Saratoga, CA (US);
Dana Lee, Saratoga, CA (US);
Jianmin Huang, San Carlos, CA (US);
Assignee:
SanDisk Technologies LLC, Plano, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/02 (2006.01); G11C 29/00 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0246 (2013.01); G11C 16/349 (2013.01); G11C 29/82 (2013.01); G11C 29/88 (2013.01); G06F 2212/1036 (2013.01); G06F 2212/7205 (2013.01); G06F 2212/7208 (2013.01); G06F 2212/7211 (2013.01);
Abstract
In a block-erasable nonvolatile memory array, blocks are categorized as bad blocks, prime blocks, and sub-prime blocks. Sub-prime blocks are identified from their proximity to bad blocks or from testing. Sub-prime blocks are configured for limited operation (e.g. only storing non-critical data, or data copied elsewhere, or using some additional or enhanced redundancy scheme).