The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Feb. 03, 2016
Applicant:

Aehr Test Systems, Fremont, CA (US);

Inventors:

Steven C. Steps, Saratoga, CA (US);

Scott E. Lindsey, Brentwood, CA (US);

Kenneth W. Deboe, Santa Clara, CA (US);

Donald P. Richmond, II, Palo Alto, CA (US);

Alberto Calderon, San Jose, CA (US);

Assignee:

Aehr Test Systems, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/10 (2006.01); G01R 31/28 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2875 (2013.01); G01R 31/2863 (2013.01); G01R 31/2865 (2013.01); G01R 31/2879 (2013.01); G01R 1/0491 (2013.01);
Abstract

The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.


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