The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Jul. 30, 2012
Kazuaki Ohkubo, Kusatsu, JP;
Hisashi Shiraiwa, Koka, JP;
Kazuaki Ohkubo, Kusatsu, JP;
Hisashi Shiraiwa, Koka, JP;
OTSUKA ELECTRONICS CO., LTD., Osaka, JP;
Abstract
An optical measurement apparatus includes: a hollow cylindrical member having one plane with a first opening and the other plane with a second opening; a rotation mechanism for rotating the cylindrical member about a first axis; a support unit for arranging a light source at a measurement position which is on the first axis and from which the emitted light enters the cylindrical member through the first opening; a first reflection unit arranged inside the cylindrical member for reflecting the light emitted from the light source and entering through the first opening; a second reflection unit for reflecting the light inside the cylindrical member and propagating the light through the second opening along the first axis to the outside of the cylindrical member; and at least one third reflection unit for causing the light reflected by the first reflection unit to be incident on the second reflection unit.