The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2016

Filed:

Nov. 20, 2013
Applicant:

Globalfoundries Singapore Pte. Ltd., Singapore, SG;

Inventors:

Tsu Hau Ng, Singapore, SG;

Zhihong Mai, Singapore, SG;

Mohammed Khalid Bin Dawood, Singapore, SG;

Pik Kee Tan, Singapore, SG;

Yamin Huang, Singapore, SG;

Jeffrey Chor-Keung Lam, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 41/06 (2012.01); H01L 21/66 (2006.01); B24B 49/12 (2006.01); G01N 1/32 (2006.01);
U.S. Cl.
CPC ...
H01L 22/12 (2013.01); B24B 49/12 (2013.01); G01N 1/32 (2013.01); H01J 2237/20 (2013.01);
Abstract

A multiple-sample-holder polishing setup for cross-section sample preparation and a method of making a device using the same are presented. The multiple-sample-holder polishing setup includes a frame. The frame has a hollow center, one or more long and short rods and a recess for accommodating a polishing head. The setup includes one or more sample holders. The sample holder is to be attached to the one or more long and short rods of the frame. A paddle is affixed to each sample holder. A sample is attached to the paddle. The sample is coated with a thin epoxy layer prior to polishing thereby allowing for easy inspection for site of interests as well as quick material removal.


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