The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2016

Filed:

Dec. 06, 2013
Applicant:

Hicon Co., Ltd., Gyeonggi-do, KR;

Inventors:

Dong Weon Hwang, Seoul, KR;

Jae Suk Hwang, Berkeley, CA (US);

Jae Baek Hwang, Seoul, KR;

Assignees:

HICON CO., LTD., Seongnam-si, Gyeonggi-do, KR;

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 1/04 (2006.01); G01R 31/26 (2014.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/0466 (2013.01); G01R 31/2601 (2013.01); G01R 31/2863 (2013.01); G01R 1/0483 (2013.01);
Abstract

The present invention relates to a socket device for testing a semiconductor device. More particularly, the present invention relates to a socket device that is capable of testing ball grid array (BGA) and land grid array (LGA) type semiconductor devices, or BGA/LGA hybrid semiconductor devices according to the shapes of leads of the semiconductor devices. A latch structure for pressing and holding a semiconductor device is improved such that a roller is provided at the front end of a latch so as to minimize wear caused by friction with a sandpaper-like surface on an upper surface of the semiconductor device, even in the case of approximately one hundred thousand or more rounds of testing, thereby remarkably extending the life of the socket device, increasing testing efficiency, and reducing costs.


Find Patent Forward Citations

Hwang, Dong. (2016). Socket device for testing semiconductor device (U.S. Patent No. 9494616). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9494616

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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