The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9494411 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 15, 2016

Filed:

Dec. 06, 2013
Applicant:

3dragons, Llc, Nagoya-shi, Aichi, JP;

Inventors:

Hideyoshi Horimai, Nuamzu, JP;

Taizo Umezaki, Kasugai, JP;

Assignee:

3DRAGONS, LLC, Aichi, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/023 (2006.01); G01B 9/02 (2006.01); G01B 11/24 (2006.01); G03H 1/00 (2006.01); G03H 1/04 (2006.01);
U.S. Cl.
CPC ...
G01B 9/023 (2013.01); G01B 9/02011 (2013.01); G01B 9/02047 (2013.01); G01B 9/02076 (2013.01); G01B 11/2441 (2013.01); G03H 1/0443 (2013.01); G01B 2290/70 (2013.01); G03H 2001/0033 (2013.01); G03H 2001/0458 (2013.01); G03H 2222/31 (2013.01);
Abstract

[Problem] To provide a low-cost, high-precision three-dimensional shape measuring device using vibration-resistant phase shift digital holography. [Solution] A three-dimensional shape measuring device, wherein an object-light optical system allows object light to be incident on a polarization element for detecting relative phase differences in a first circularly polarized light state, a reference-light optical system allows a reference light to be incident on a polarization element for detecting relative phase differences in a second circularly polarized light state in the direction opposite from the first circularly polarized light, and the polarization element for detecting relative phase differences transmits a component of the object light, which is the first circularly polarized light, in the polarization direction of the polarization element for detecting relative phase differences, and a component of the reference light, which is the second circularly polarized light, in the polarization direction of the polarization element for detecting relative phase differences. The polarization direction of the polarization element for detecting relative phase differences is rotated to thereby vary the relative phase difference between the object light and the reference light transmitted through the polarization element for detecting relative phase differences and to acquire a plurality of hologram images having different relative phase differences.


Find Patent Forward Citations

Horimai, Hideyoshi. (2016). Three-dimensional shape measuring device, method for acquiring hologram image, and method for measuring three-dimensional shape (U.S. Patent No. 9494411). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9494411

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