The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

Aug. 19, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Gerald K. Bartley, Rochester, MN (US);

Darryl J. Becker, Rochester, MN (US);

Matthew S. Doyle, Rochester, MN (US);

Philip R. Germann, Oronoco, MN (US);

Mark O. Maxson, Mantorville, MN (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 31/28 (2006.01); B23Q 17/20 (2006.01); G01R 27/26 (2006.01); H05K 3/00 (2006.01); H05K 3/42 (2006.01); H05K 1/02 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2801 (2013.01); B23Q 17/20 (2013.01); G01R 1/067 (2013.01); G01R 27/2605 (2013.01); G01R 31/28 (2013.01); H05K 3/0047 (2013.01); H05K 3/429 (2013.01); H05K 1/0251 (2013.01); H05K 2201/096 (2013.01); H05K 2201/09845 (2013.01); H05K 2203/0207 (2013.01); H05K 2203/163 (2013.01); Y10T 29/49005 (2015.01); Y10T 29/49156 (2015.01); Y10T 29/49726 (2015.01); Y10T 408/05 (2015.01);
Abstract

A stub of a via formed in a printed circuit board is backdrilled to a predetermined depth. A capacitance probe is positioned within the via. Then the capacitance probe is used to obtain a test capacitance measurement. The test capacitance measurement is compared to a predetermined baseline capacitance measurement. Residual conductive plating material in the backdrilled stub causes the test capacitance measurement to exceed the predetermined baseline capacitance measurement. An indication is made that the predetermined baseline capacitance measurement has been exceeded.


Find Patent Forward Citations

Loading…