The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
Aug. 30, 2013
Massachusetts Institute of Technology, Cambridge, MA (US);
Irene Bosch, Brookline, MA (US);
Kimberly S. Hamad-Schifferli, Somerville, MA (US);
Lee Gehrke, Cotuit, MA (US);
Nevan Clancy Hanumara, Kingston, RI (US);
Jacqueline Linnes, West Lafayette, IN (US);
David Wood, Somerville, MA (US);
Jose F. Gomez-Marquez, Cambridge, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
Exemplary embodiments provide diagnostic devices, systems and methods for determining the presence or absence of one or more markers or characteristics in one or more samples. An exemplary diagnostic device may display a first two-dimensional machine-readable output to indicate the presence or absence of a first characteristic in a sample. Similarly, the exemplary diagnostic device may display a second two-dimensional machine-readable output to indicate the presence or absence of a second characteristic in a sample. An image capture device may be used to automatically detect the two-dimensional machine-readable output appearing in the diagnostic device. A computational device may be used to automatically determine whether the presence or absence of the first characteristic and/or the second characteristic based on the two-dimensional machine-readable output displayed in the diagnostic device.