The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2016

Filed:

Apr. 08, 2015
Applicant:

Oracle International Corporation, Redwood City, CA (US);

Inventors:

Jianghui Su, San Jose, CA (US);

Yan Yan, San Jose, CA (US);

Jieda Li, Evanston, IL (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/08 (2006.01); H04B 1/10 (2006.01); H04B 17/24 (2015.01); H04B 17/21 (2015.01);
U.S. Cl.
CPC ...
H04B 1/1027 (2013.01); H04B 17/21 (2015.01); H04B 17/24 (2015.01);
Abstract

An embodiment includes a receiver circuit, a feedback circuit and a control circuit. The receiver circuit is configured to receive each data bit of a plurality of data bits. The feedback circuit is configured to measure a first interference level generated by a first data bit of a first subset of the plurality of data bits on a second data bit of the plurality of data bits to generate one of a first plurality of feedback values. The feedback circuit is also configured to measure a second interference level generated by a third data bit of a second subset of the plurality of data bits on a fourth data bit of the plurality of data bits to generate one of a second plurality of feedback values. The control circuit is configured to determine a duty cycle dependent upon a comparison of the first plurality to the second plurality.


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