The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2016

Filed:

Oct. 05, 2010
Applicants:

Daniel K. Berkoh, Woodland Hills, CA (US);

Elena B. Woodard, Fillmore, CA (US);

Dean G. Scott, Mesa, AZ (US);

Inventors:

Daniel K. Berkoh, Woodland Hills, CA (US);

Elena B. Woodard, Fillmore, CA (US);

Dean G. Scott, Mesa, AZ (US);

Assignee:

SKYWORKS SOLUTIONS, INC., Woburn, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01L 21/306 (2006.01); H01L 21/3065 (2006.01); H01L 21/683 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 21/30621 (2013.01); H01J 37/32642 (2013.01); H01J 37/32651 (2013.01); H01L 21/3065 (2013.01); H01L 21/6835 (2013.01); H01L 21/76898 (2013.01); H01L 2221/6834 (2013.01); H01L 2221/68327 (2013.01); H01L 2221/68372 (2013.01); H01L 2221/68381 (2013.01);
Abstract

Apparatus and methods for plasma etching are disclosed. In one embodiment, a method of etching a plurality of features on a wafer includes positioning a wafer on a feature plate within a chamber of a plasma etcher, providing a plasma source gas within the chamber, providing an anode above the feature plate and a cathode below the feature plate, connecting a portion of the cathode to the feature plate, generating plasma ions using a radio frequency power source and the plasma source gas, directing the plasma ions toward the wafer using an electric field, and providing an electrode shield around the cathode. The electrode shield is configured to protect the cathode from ions directed toward the cathode including the portion of the cathode connected to the feature plate.


Find Patent Forward Citations

Berkoh, Daniel. (2016). Apparatus and methods for shielding a plasma etcher electrode (U.S. Patent No. 9478428). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9478428

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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