The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2016
Filed:
Jun. 23, 2014
Applicant:
Samsung Electronics Co., Ltd., Suwon-Si, Gyeonggi-Do, KR;
Inventors:
Hyun-Ho Shin, Hanam-Si, KR;
Heung-Soo Lim, Yongin-Si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, Gyeongg-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 16/26 (2006.01); G11C 16/34 (2006.01); G11C 29/52 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01); G06F 11/1048 (2013.01); G11C 16/34 (2013.01); G11C 29/52 (2013.01);
Abstract
A method of reading data in a memory system including a non-volatile memory device, includes reading first data stored in a first block using a first read scheme capable of detecting/correcting an error in the first data, and upon determining an uncorrected error in the first data, setting the first block as a first temporary bad block and reading second data stored in the first temporary bad block using a second read scheme different from the first read scheme.