The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2016

Filed:

Apr. 22, 2014
Applicant:

Mitsubishi Gas Chemical Company, Inc., Tokyo, JP;

Inventors:

Shoichi Hayakawa, Mie, JP;

Yoshio Nishimura, Chiba, JP;

Kikuo Furukawa, Tokyo, JP;

Hiroyasu Tanaka, Chiba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/039 (2006.01); C08F 220/28 (2006.01); C07C 67/26 (2006.01); C07C 69/757 (2006.01); C08L 33/14 (2006.01);
U.S. Cl.
CPC ...
G03F 7/039 (2013.01); C07C 67/26 (2013.01); C07C 69/757 (2013.01); C08F 220/28 (2013.01); C08L 33/14 (2013.01); C07C 2103/74 (2013.01); C08F 2220/285 (2013.01);
Abstract

The present invention provides, as a chemically amplified resist, a well-balanced resist or compound which results in improved sensitivity, resolution and line edge roughness (LER) without impairing the fundamental physical properties required as a resist (e.g., pattern shape, dry etching resistance, heat resistance). A mixture of cycloaliphatic ester compounds represented by general formulae (1) to (3), and a process for preparation thereof, as well as a (meth)acrylic copolymer comprising the cycloaliphatic ester compounds of general formulae (1) to (3) and a photosensitive resin composition thereof are provided.


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