The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2016

Filed:

Apr. 17, 2012
Applicants:

Shinichi Nakamura, Tokyo, JP;

Fumiaki Nanami, Tokyo, JP;

Inventors:

Shinichi Nakamura, Tokyo, JP;

Fumiaki Nanami, Tokyo, JP;

Assignee:

UNITECHNO, INC., Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 1/067 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/073 (2013.01); G01R 1/06722 (2013.01); G01R 31/2884 (2013.01); G01R 31/2886 (2013.01); G01R 1/06738 (2013.01);
Abstract

A Kelvin inspection fixture is provided with contact probes, wherein the contact probe comprises an electrode side contact terminal in contact with a solder ball, and a land side contact terminal in contact with a land, and the contact probe comprises an electrode side contact terminal in contact with the solder ball, and a land side contact terminal in contact with a land. The contact probes are disposed so that an electrode side inclined face and an electrode side inclined face are held in an opposite relationship with respect to each other and so that a land side inclined face and a land side inclined face are held in a face to face relationship with respect to each other.


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