The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2016

Filed:

May. 10, 2010
Applicants:

Satoshi Mitsuyama, Tokyo, JP;

Chihiro Manri, Kawagoe, JP;

Tomonori Mimura, Kasama, JP;

Kumiko Kamihara, Mito, JP;

Inventors:

Satoshi Mitsuyama, Tokyo, JP;

Chihiro Manri, Kawagoe, JP;

Tomonori Mimura, Kasama, JP;

Kumiko Kamihara, Mito, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00663 (2013.01); G01N 35/00623 (2013.01); G01N 2035/0097 (2013.01); G01N 2035/00702 (2013.01);
Abstract

Provided are an automated analyzer and an automatic analysis method for highly accurately determining presence or absence of abnormality based on reaction process data obtained when concentration of a chemical component or an activity level of an enzyme is measured. The reaction process data is approximated by a function, and shape feature quantities indicating features of a shape of a curve section at an early stage of reaction are calculated. The obtained shape feature quantities are used to determine the presence or absence of abnormality.


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