The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9472670 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 18, 2016

Filed:

Mar. 30, 2016
Applicants:

International Business Machines Corporation, Armonk, NY (US);

Globalfoundries, Inc., Grand Cayman, KY;

Inventors:

Rama Kambhampati, Milpitas, CA (US);

Junli Wang, Singerlands, NY (US);

Ruilong Xie, Schenectady, NY (US);

Tenko Yamashita, Schenectady, NY (US);

Assignees:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 21/84 (2006.01); H01L 21/8238 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7848 (2013.01); H01L 21/823807 (2013.01); H01L 21/823814 (2013.01); H01L 21/823821 (2013.01); H01L 21/823864 (2013.01); H01L 21/845 (2013.01); H01L 29/66545 (2013.01);
Abstract

A method for forming field effect transistors comprises forming a first dummy gate stack over a first fin, forming a second dummy gate stack over a second fin, depositing a first layer of spacer material on the first dummy gate stack, the first fin, the second dummy gate stack, and the second fin, patterning a first masking layer on the first dummy gate stack and the first fin, etching to remove portions of the first layer of spacer material and form a spacer adjacent to the second dummy gate stack, removing the first masking layer, epitaxially growing a silicon material on the second fin, depositing a layer of oxide material on the first layer of spacer material, the first epitaxial material and the second dummy gate stack, and depositing a second layer of spacer material on the layer of oxide material.


Find Patent Forward Citations

Kambhampati, Rama. (2016). Field effect transistor device spacers (U.S. Patent No. 9472670). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9472670

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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