The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Aug. 28, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Huihang Dong, Danbury, CT (US);

Wai-Kin Li, Hopewell Junction, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01); H01L 21/8238 (2006.01); H01L 21/265 (2006.01); H01L 21/84 (2006.01);
U.S. Cl.
CPC ...
H01L 21/823821 (2013.01); H01L 21/26586 (2013.01); H01L 21/823814 (2013.01); H01L 21/845 (2013.01); H01L 21/26513 (2013.01);
Abstract

After forming an organic planarization layer (OPL) atop a substrate which includes a plurality of semiconductor fins and a gate structure thereon, the OPL is recessed such that uppermost surfaces of remaining portions of the OPL are located below an uppermost surface of the gate structure but above top surfaces of the semiconductor fins. The remaining portions of the OPL are patterned to expose semiconductor fins in a pFinFET region for subsequent ion implantation. Portions of the OPL that remain on the semiconductor fins in an nFinFET region act as an implantation mask to shield the semiconductor fins in the nFinFET region from the ion implantation.


Find Patent Forward Citations

Loading…