The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

May. 28, 2015
Applicant:

Hitachi Kokusai Electric, Inc., Tokyo, JP;

Inventors:

Tatsuyuki Saito, Toyama, JP;

Masanori Sakai, Takaoka, JP;

Yukinao Kaga, Toyama, JP;

Takashi Yokogawa, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); C23C 16/34 (2006.01); C23C 16/455 (2006.01); C23C 16/52 (2006.01); H01L 21/285 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0228 (2013.01); C23C 16/34 (2013.01); C23C 16/45523 (2013.01); C23C 16/45544 (2013.01); C23C 16/45563 (2013.01); C23C 16/52 (2013.01); H01L 21/02104 (2013.01); H01L 21/02172 (2013.01); H01L 21/02225 (2013.01); H01L 21/02263 (2013.01); H01L 21/02271 (2013.01); H01L 21/28506 (2013.01);
Abstract

There are provided a method of manufacturing a semiconductor device, a substrate processing apparatus, and a semiconductor device. The method allows rapid formation of a conductive film, which has a low concentration of impurities permeated from a source owing to its dense structure, and a low resistivity. The method is performed by simultaneously supplying two or more kinds of sources into a processing chamber to form a film on a substrate placed in the processing chamber. The method comprises: performing a first source supply process by supplying at least one kind of source into the processing chamber at a first supply flow rate; and performing a second source supply process by supplying the at least one kind of source into the processing chamber at a second supply flow rate different from the first supply flow rate.


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