The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2016
Filed:
Mar. 31, 2011
Ang Liu, Beijing, CN;
Yangzhou Du, Beijing, CN;
Tao Wang, Beijing, CN;
Jianguo LI, Beijing, CN;
Qiang LI, Beijing, CN;
Yimin Zhang, Beijing, CN;
Ang Liu, Beijing, CN;
Yangzhou Du, Beijing, CN;
Tao Wang, Beijing, CN;
Jianguo Li, Beijing, CN;
Qiang Li, Beijing, CN;
Yimin Zhang, Beijing, CN;
Intel Corporation, Santa Clara, CA (US);
Abstract
Detecting facial landmarks in a face detected in an image may be performed by first cropping a face rectangle region of the detected face in the image and generating an integral image based at least in part on the face rectangle region. Next, a cascade classifier may be executed for each facial landmark of the face rectangle region to produce one response image for each facial landmark based at least in part on the integral image. A plurality of Active Shape Model (ASM) initializations may be set up. ASM searching may be performed for each of the ASM initializations based at least in part on the response images, each ASM search resulting in a search result having a cost. Finally, a search result of the ASM searches having a lowest cost function may be selected, the selected search result indicating locations of the facial landmarks in the image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile