The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2016
Filed:
Oct. 28, 2011
Stephen J. Bourassa, Tewksbury, MA (US);
Michael Francis Mcgoldrick, North Reading, MA (US);
David Kaushansky, Belmont, MA (US);
Michael Thomas Fluet, Litchfield, NH (US);
Stephen J. Bourassa, Tewksbury, MA (US);
Michael Francis McGoldrick, North Reading, MA (US);
David Kaushansky, Belmont, MA (US);
Michael Thomas Fluet, Litchfield, NH (US);
Teradyne, Inc., North Reading, MA (US);
Abstract
In general, a test instrument includes a processing system programmed to control operation of the test instrument, including communication with a control system, and programmed to run one or more test programs to test a device interfaced to the test instrument, the processing system including multiple processing devices, and a configurable interface, through which communications are exchanged with the device interfaced to the test instrument, the configurable interface including physical ports, to which different configurations are assignable.